Yazar "Serin, T." için listeleme
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The change in the electrical transport mechanism from the grain boundary conduction to the nearest-neighbor hopping conduction in SnO2
Yildiz, A.; Alsac, A. A.; Serin, T.; Serin, N. (SPRINGER, 2011)The electrical conductivity measurements on SnO2 over a wide range of temperatures were performed. The results provided experimental evidence for a transition from the grain boundary (GB) conduction at high temperatures ... -
Effect of gamma irradiation on the shallow defect states of hydrogenated amorphous silicon films
Yildiz, A.; Serin, N.; Serin, T. (EDP SCIENCES S A, 2011)The temperature dependence of the electrical conductivity before and after gamma irradiation of hydrogenated amorphous silicon (a-Si:H) films, prepared by the hot wire method, at a dose of 2 kGy of (60)Co gamma irradiation ... -
The effect of intrinsic defects on the hole transport in Cu2O
Yildiz, A.; Serin, N.; Serin, T.; Kasap, M. (NATL INST OPTOELECTRONICS, 2009)Structural and electrical properties of Cu2O bulk samples are characterized by X-Ray diffraction (XRD) and Hall effect measurements. The variation of the carrier concentration with temperature is explained in terms of the ... -
Electrical conduction properties of In-doped ZnO thin films
Serin, T.; Yildiz, A.; Uzun, S.; Cam, E.; Serin, N. (IOP PUBLISHING LTD, 2011)The electrical conduction mechanism of undoped and In-doped ZnO thin films is investigated. The behavior of conductivity is consistent with the variable-range hopping conduction mechanism. From the experimental data, the ... -
Estimation of compensation ratio by identifying the presence of different hopping conduction mechanisms in SnO2 thin films
Serin, N.; Yildiz, A.; Alsac, A. A.; Serin, T. (ELSEVIER SCIENCE SA, 2011)The electrical properties of undoped SnO2 thin films prepared by the sol-gel technique were investigated by conductivity measurements in a temperature range of 50-200 K. Structural characterizations of the films were ... -
Extraction of important electrical parameters of CuO
Serin, T.; Yildiz, A.; Sahin, S. Horzum; Serin, N. (ELSEVIER SCIENCE BV, 2011)Conductivity, X-ray diffraction (XRD), optical absorption and atomic force microscopy (AFM) measurements of CuO thin film were presented. Three distinct electrical conduction contributions with discrete characteristic ... -
Multiphonon hopping of carriers in CuO thin films
Serin, T.; Yildiz, A.; Sahin, S. H.; Serin, N. (ELSEVIER SCIENCE BV, 2011)We have performed a detailed study of the electrical conduction process in CuO thin films deposited by the sol-gel dip coating technique in a temperature range 280-420 K. The electrical conduction is analyzed within the ... -
The thickness effect on the electrical conduction mechanism in titanium oxide thin films
Yildiz, A.; Serin, N.; Kasap, M.; Serin, T.; Mardare, Diana (ELSEVIER SCIENCE SA, 2010)In this paper we made a study on the effect of films thickness on the electrical conduction properties of nanostructured TiO(2) thin films deposited by d.c. reactive sputtering. The deposition was performed on heated (573 ...
