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dc.contributor.authorYildiz, Abdullah
dc.contributor.authorIacomi, Felicia
dc.contributor.authorMardare, Diana
dc.date.accessioned2019-11-24T20:37:29Z
dc.date.available2019-11-24T20:37:29Z
dc.date.issued2010
dc.identifier.issn0021-8979
dc.identifier.issn1089-7550
dc.identifier.urihttps://dx.doi.org/10.1063/1.3493742
dc.identifier.urihttps://hdl.handle.net/20.500.12513/2368
dc.descriptionWOS: 000283745100059en_US
dc.description.abstractUndoped and Fe-doped TiO2 thin films were obtained by rf-sputtering technique onto heated glass substrates (250 degrees C) covered with indium tin oxide. The temperature dependence of the electrical conductivity was investigated in the temperature range 13-320 K, and it shows that the conduction mechanism in the studied samples is described by small-polaron hopping (SPH) at temperatures higher than half of the Debye temperature (theta(D)). It was found that the magnitude of the SPH coupling increases by Fe doping in TiO2 thin films. With decreasing temperature, the conduction behavior transited from SPH conduction to variable-range hopping (VRH) conduction. In the intermediate temperature domain (200 K<T<theta(D)/2), the VRH conduction was found to be dominant, while a temperature-independent conductivity behavior was observed in the lower temperature range (T<200 K). (C) 2010 American Institute of Physics. [doi: 10.1063/1.3493742]en_US
dc.description.sponsorshipCNCSISConsiliul National al Cercetarii Stiintifice din Invatamantul Superior (CNCSIS) [PCCE-ID_76, 12128/2008]en_US
dc.description.sponsorshipOne of the authors (D. Mardare) is grateful to Professor F. Levy from Institute of Applied Physics, Polytechnic Federal School of Lausanne, Switzerland for providing the necessary laboratory facilities to carry out a part of this investigation. This work was supported by CNCSIS Contract No. PCCE-ID_76 and by Grant No. 12128/2008.en_US
dc.language.isoengen_US
dc.publisherAMER INST PHYSICSen_US
dc.relation.isversionof10.1063/1.3493742en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titlePolaron transport in TiO2 thin filmsen_US
dc.typearticleen_US
dc.relation.journalJOURNAL OF APPLIED PHYSICSen_US
dc.contributor.departmentKırşehir Ahi Evran Üniversitesi, Fen-Edebiyat Fakültesi, Fizik Bölümüen_US
dc.identifier.volume108en_US
dc.identifier.issue8en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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