| dc.contributor.author | Yildiz, A. | |
| dc.contributor.author | Lisesivdin, S. B. | |
| dc.contributor.author | Kasap, M. | |
| dc.contributor.author | Mardare, D. | |
| dc.date.accessioned | 2019-11-24T20:37:54Z | |
| dc.date.available | 2019-11-24T20:37:54Z | |
| dc.date.issued | 2008 | |
| dc.identifier.issn | 0022-3093 | |
| dc.identifier.uri | https://dx.doi.org/10.1016/j.jnoncrysol.2008.07.009 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.12513/2438 | |
| dc.description | WOS: 000261271100006 | en_US |
| dc.description.abstract | The electrical properties of n-type titanium dioxide thin films deposited by magnetron-sputtering method have been investigated by temperature-dependent conductivity. We observed that the temperature dependence of the electrical conductivity of titanium dioxide films exhibits a crossover from T(-1/4) to T(-1/2) dependence in the temperature range between 80 and 110 K. Characteristic parameters describing conductivity, such as the characteristic temperature (T(0)). hopping distance (R(hop)), average hopping energy (Delta(hop)), Coulomb gap (Delta(C)), localization length (xi) and density of states (N(E(F))), were determined, and their values were discussed within the models describing conductivity in TiO(2) thin films. (C) 2008 Elsevier B.V. All rights reserved. | en_US |
| dc.description.sponsorship | Romanian Ministry of Education and Research [A 17/2008]; Romanian Academy [GAR 34/2008]; TUBITAKTurkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK); ANCSTurkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK) [TBAG-U/220 (107T584)] | en_US |
| dc.description.sponsorship | We would like to thank Professor F. Levy from the Institute of Applied Physics, Polytechnic Federal School of Lausanne, Switzerland, for providing the necessary laboratory facilities to carry out a part of this investigation. This work was partially supported by Romanian Ministry of Education and Research through Grant A 17/2008 and also by Romanian Academy through GAR 34/2008. The authors would also like to thank C. Baban, R. Gavrila, M. Modreanu, and G.I. Rusu. This work was also supported by TUBITAK and ANCS under Project No. TBAG-U/220 (107T584). | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | ELSEVIER SCIENCE BV | en_US |
| dc.relation.isversionof | 10.1016/j.jnoncrysol.2008.07.009 | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | Conductivity | en_US |
| dc.subject | Variable-range hopping (VRH) | en_US |
| dc.subject | TiO(2) | en_US |
| dc.title | Electrical properties of TiO(2) thin films | en_US |
| dc.type | article | en_US |
| dc.relation.journal | JOURNAL OF NON-CRYSTALLINE SOLIDS | en_US |
| dc.contributor.department | Kırşehir Ahi Evran Üniversitesi, Fen-Edebiyat Fakültesi, Fizik Bölümü | en_US |
| dc.identifier.volume | 354 | en_US |
| dc.identifier.issue | 45-46 | en_US |
| dc.identifier.startpage | 4944 | en_US |
| dc.identifier.endpage | 4947 | en_US |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
