Extraction of important electrical parameters of CuO

Abstract

Conductivity, X-ray diffraction (XRD), optical absorption and atomic force microscopy (AFM) measurements of CuO thin film were presented. Three distinct electrical conduction contributions with discrete characteristic activation energies were observed. The applicability of various theoretical models was considered to explain results on electrical transport. We extracted important electrical parameters of CuO, which might be useful for its gas sensor applications. (C) 2010 Elsevier B.V. All rights reserved.