Free surface effect on displacement and relative interfacial displacement fields of misfit dislocations at the bicrystal interface

Abstract

The displacement field u› and the relative interfacial displacement field ?u› are investigated for the material formed by two isotropic media. When one of the media tends to infinity and the other one has the thickness of h, the displacement fields depend on this thickness. Applications are presented for the CoSi2/Si(111) heterosystem and also for the homogeneous system Cu/Cu(111).